| Citation: | TU Si-qi, WANG Yong-hong, SUN Fang-yuan, GAO Xin-ya, ZHAO Qi-han, YAN Pei-zheng. Fast detection of smooth surface deformation based on DSPI[J]. Chinese Optics, 2018, 11(2): 248-254. doi: 10.3788/CO.20181102.0248
|
| [1] |
CHETWYND D G, LIU X, SMITH S T. A controlled-force stylus displacement probe[J]. Precision Engineering, 1996, 19(2-3):105-111. doi: 10.1016/S0141-6359(96)00008-6
|
| [2] |
梁嵘, 李达成, 曹芒, 等.表面微观形貌测量及其参数评定的发展趋势[J].光学技术, 1998(6):66-68. http://www.wanfangdata.com.cn/details/detail.do?_type=degree&id=Y1348050
LIANG R, LI D CH, CAO M, et al.. Measurement and characterization tendency of the surface microtopography[J]. Optical Technology, 1998(6):66-68.(in Chinese) http://www.wanfangdata.com.cn/details/detail.do?_type=degree&id=Y1348050
|
| [3] |
WRISTON R S, FROECHTE J F. Soft X-ray scattering by optical surfaces[J]. Journal of the Optical Society of America, 1972, 62(11):1399-1400. doi: 10.1117/12.936571.full
|
| [4] |
尼启良, 陈波.散射法表面粗糙度测量[J].光学精密工程, 2001, 9(2):151-154. http://d.old.wanfangdata.com.cn/Periodical/gxjmgc200102012
NI Q L, CHEN B. Measurement of surface roughness by sattering method[J]. Opt. Precision Eng., 2001, 9(2):151-154.(in Chinese) http://d.old.wanfangdata.com.cn/Periodical/gxjmgc200102012
|
| [5] |
陈淑妍, 齐立红, 陈波.光学散射法表面特征的测量与分析[J].红外与金宝搏188软件怎么用
工程, 2006, 35(1):82-85. http://d.wanfangdata.com.cn/Periodical_hwyjggc200601018.aspx
CHEN SH Y, QI L H, CHEN B. Measurement and analysis of surface profiles by optical scattering method[J]. Infrared and Laser Engineering, 2006, 35(1):82-85.(in Chinese) http://d.wanfangdata.com.cn/Periodical_hwyjggc200601018.aspx
|
| [6] |
王英姿, 侯宪钦.带能谱分析的扫描电子显微镜在材料分析中的应用[J].工艺与检测, 2007(9):80-83. http://www.doc88.com/p-98336881984.html
WANG Y Z, HOU X Q. Application of SEM with EDX in material analysis[J]. Technology and Test, 2007(9):80-83.(in Chinese) http://www.doc88.com/p-98336881984.html
|
| [7] |
王肖沐, 肖宇彬, 许建斌.扫描探针显微镜在石墨烯研究中的应用[J].电子显微学报, 2012, 31(1):74-86. http://www.wanfangdata.com.cn/details/detail.do?_type=perio&id=dzxwxb201201015
WANG X M, XIAO Y B, XU J B. Graphene with scanning probe microscopy:a review[J]. Journal of Chinese Electron Microscopy Society, 2012, 31(1):74-86.(in Chinese) http://www.wanfangdata.com.cn/details/detail.do?_type=perio&id=dzxwxb201201015
|
| [8] |
史琪琪, 高志山, 王帅, 等. 基于白光干涉的微观轮廓复原技术研究[C]. 全国光学测试学术交流会. 2014. http://cpfd.cnki.com.cn/Article/CPFDTOTAL-GNCS201410001121.htm
|
| [9] |
WANG Y, WU S, YANG L. Synchronous measurement of three-dimensional deformations by multicamera digital speckle patterns interferometry[J]. Optical Engineering, 2016, 55(9):091408. doi: 10.1117/1.OE.55.9.091408
|
| [10] |
LI J R, XIE X, YANG G B, et al.. Whole-field thickness strain measurement using multiple camera digital image correlation system[J]. Optics & Lasers in Engineering, 2017, 90:19-25. https://www.sciencedirect.com/science/article/pii/S0143816616302184
|
| [11] |
王永红, 冯家亚, 王鑫, 等.基于狭缝光阑的剪切散斑干涉动态测量[J].光学精密工程, 2015, 23(3):645-651. http://d.old.wanfangdata.com.cn/Periodical/gxjmgc201503006
WANG Y H, FENG J Y, WANG X, et al.. Shearing speckle interferometry based on slit aperture for dynamic measurement[J]. Opt. Precision Eng., 2015, 23(3):645-651.(in Chinese) http://d.old.wanfangdata.com.cn/Periodical/gxjmgc201503006
|
| [12] |
孙永建, 孙晓明, 刘云起, 等.基于线性扩散板的高光抑制方法研究[J].液晶与显示, 2016, 31(9):897-901. http://www.opticsjournal.net/abstract.htm?id=OJ1305070000536B8EaH
SUN Y J, SUN X M, LIU Y Q, et al.. Specular highlight suppression method based on linear diffuser[J]. Chinese Journal of Liquid Crystals and Displays, 2016, 31(9):897-901.(in Chinese) http://www.opticsjournal.net/abstract.htm?id=OJ1305070000536B8EaH
|
| [13] |
王永红, 吕有斌, 高新亚, 等.剪切散斑干涉技术及应用研究进展[J].中国光学, 2017, 10(3):300-309. //www.illord.com/CN/abstract/abstract9525.shtml
WANG Y H, LV Y B, GAO X Y, et al.. Research progress in shearography and its applications[J]. Chinese Optics, 2017, 10(3):300-309.(in Chinese) //www.illord.com/CN/abstract/abstract9525.shtml
|
| [14] |
田青, 王辉, 任志君.数字全息再现像的金宝搏188软件怎么用
散斑消除的研究[J].应用金宝搏188软件怎么用
, 2006, 26(6):439-442. http://www.opticsjournal.net/abstract.htm?aid=OJ130416000176HeKgNj
TIAN Q, WANG H, REN ZH J. Reduction of speckle noise in digital holography[J]. Applied Laser, 2006, 26(6):439-442.(in Chinese) http://www.opticsjournal.net/abstract.htm?aid=OJ130416000176HeKgNj
|
| [15] |
刘佩, 王永红, 冯家亚, 等.偏转角空间载波相位检测技术[J].光电工程, 2015, 42(3):39-43. http://d.wanfangdata.com.cn/Periodical_gdgc201503007.aspx
LIU P, WANG Y H, FENG J Y, et al.. Phase detection technology in spatial carriar based on deflection angle[J]. Opto-Electronic Engineering, 2015, 42(3):39-43.(in Chinese) http://d.wanfangdata.com.cn/Periodical_gdgc201503007.aspx
|
| [16] |
LI J R, XU W, XIE X, et al.. Experimental study of FLD0 for aluminum alloy using digital image correlation with modified ISO method[J]. International Journal of Materials Research, 2016, 107(3):245-253. doi: 10.3139/146.111340
|
| [17] |
杨连祥, 祝连庆, 谢辛, 等.电子散斑干涉测量中相移技术的新发展[J].北京信息科技大学学报(自然科学版), 2013(2):1-8. http://www.wanfangdata.com.cn/details/detail.do?_type=degree&id=D207829
YANG L X, ZHU L Q, XIE X, et al.. New development of phase-shift techniques in electronic speckle pattern interferometry[J]. Journal of Beijing Information Science and Technology University, 2013(2):1-8.(in Chinese) http://www.wanfangdata.com.cn/details/detail.do?_type=degree&id=D207829
|
| [18] |
汪相如, 贺晓娴, 方琳, 等.傅立叶1/4波片法检测液晶光学相控阵移相量的精度分析[J].液晶与显示, 2017, 32(1):7-12. http://kns.cnki.net/KCMS/detail/detail.aspx?filename=yjys201701002&dbname=CJFD&dbcode=CJFQ
WANG X R, HE X X, FANG L, et al.. Precision analysis on the phase delay measurement method of Fourier quarter-wave-plate on liquid crystal optical phased array[J]. Chinese Journal of Liquid Crystals and Displays, 2017, 32(1):7-12.(in Chinese) http://kns.cnki.net/KCMS/detail/detail.aspx?filename=yjys201701002&dbname=CJFD&dbcode=CJFQ
|
| [19] |
蔡长青. 散斑干涉计量关键问题研究及其应用[D]. 广州: 华南理工大学, 2013 http://cdmd.cnki.com.cn/Article/CDMD-10561-1013320265.htm
CAI CH Q. The research of key issues in speckle interferometry measurement and its application[D]. Guangzhou: South China University of Technology, 2013. (in Chinese) http://cdmd.cnki.com.cn/Article/CDMD-10561-1013320265.htm
|
| [20] |
HANSEN R S. A compact ESPI system for displacement measurements of specular reflecting or optical rough surfaces[J]. Optics & Lasers in Engineering, 2004, 41(1):73-80. https://www.sciencedirect.com/science/article/pii/S0143816602001355
|
| [21] |
LI J, XIE X, YANG G, et al.. Whole-field thickness strain measurement using multiple camera digital image correlation system[J]. Optics & Lasers in Engineering, 2017, 90:19-25. https://www.researchgate.net/publication/308876894_Whole-field_thickness_strain_measurement_using_multiple_camera_digital_image_correlation_system
|
| [22] |
刘国宏, 郭文明.改进的中值滤波去噪算法应用分析[J].计算机工程与应用, 2010, 46(10):187-189. doi: 10.3778/j.issn.1002-8331.2010.10.059
LIU G H, GUO W M. Application of improved arithmatic of median filter denosing[J]. Computer Engineering and Applications, 2010, 46(10):187-189.(in Chinese) doi: 10.3778/j.issn.1002-8331.2010.10.059
|
| [23] |
朱士虎, 游春霞.一种改进的均值滤波算法[J].计算机应用与软件, 2013, 30(12):97-99, 116. doi: 10.3969/j.issn.1000-386x.2013.12.025
ZHU SH H, YOU CH X. A modified average flitering algorithm[J]. Computer Application and Software, 2013, 30(12):97-99, 116.(in Chinese) doi: 10.3969/j.issn.1000-386x.2013.12.025
|
| [24] |
王永红, 李骏睿, 孙建飞, 等.散斑干涉相位条纹图的频域滤波处理[J].中国光学, 2014, 7(3):389-395. //www.illord.com/CN/abstract/abstract9139.shtml
WANG Y H, LI J R, SUN J F, et al.. Frequency domain flitering for phase pattern of digital speckle pattern interferometry[J]. Chinese Optics, 2014, 7(3):389-395.(in Chinese) //www.illord.com/CN/abstract/abstract9139.shtml
|
Figures(8) / Tables(1)
DownLoad:
